- Air Sampling
- Atomic Force Microscopy
- Auger Electron Spectroscopy
- Electron Spectroscopy (Chemical Analysis)
- Electron Dispersive X-Ray Spectroscopy
- Focused Ion Beam
- Fourier Transform Infrared Spectroscopy
- Gas Chromatography / Mass Spectroscopy
- High Performance Liquid Chromatography
- Ion Chromatography

- Inductively Coupled Plasma/Mass Spectroscopy
- Liquid Particle Counting
- Nuclear Magnetic Resonance Spectroscopy
- Raman Spectroscopy
- Scanning Electron Microscopy
- Surface Scan Particle Counting
- Time-to-Flight Secondary Ion Mass Spectroscopy
- Total Organic Carbon Analysis
- Transmission Electron Microscopy
 -X-Ray Diffraction